Spectral bench
Characterization of spatial filters
- Accuracy of flux measurements: ± 0.5% in transmission and reflection
- Incidence angle of the transmission measurement: from 0° to 30°
- Incidence angle of the measurement in reflection: 5 °
- Wavelengths measured: from 350nm to 1100nm
- Equipped with 6 diaphragms
- Max size measurable components: 200mm x 200mm
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: Spectral bench